Mems devices and methods of forming same

ABSTRACT

A microelectromechanical system (MEMS) device may include a MEMS structure over a first substrate. The MEMS structure comprises a movable element. Depositing a first conductive material over the first substrate and etching trenches in a second substrate. Filling the trenches with a second conductive material and depositing a third conductive material over the second conductive material and the second substrate. Bonding the first substrate and the second substrate and thinning a backside of the second substrate which exposes the second conductive material in the trenches.

PRIORITY CLAIM AND CROSS-REFERENCE

This application is a divisional of U.S. patent application Ser. No.14/624,008, filed Feb. 17, 2015, which is a divisional of U.S. patentapplication Ser. No. 13/571,264, filed Aug. 9, 2012 (now U.S. Pat. No.8,987,059, Issued Mar. 24, 2015), which claims the benefit of U.S.Provisional Application No. 61/583,048, filed on Jan. 4, 2012, whichapplications are hereby incorporated herein by reference.

BACKGROUND

Microelectromechanical systems (“MEMS”) are becoming increasinglypopular, particularly as such devices are miniaturized and areintegrated into integrated circuit manufacturing processes. MEMS devicesintroduce their own unique requirements into the integration process,however. Electrically interconnecting MEMS devices is an area of uniquechallenges.

BRIEF DESCRIPTION OF THE DRAWINGS

For a more complete understanding of the present embodiments, and theadvantages thereof, reference is now made to the following descriptionstaken in conjunction with the accompanying drawings, in which:

FIGS. 1a through 1i illustrate in cross section steps in the processingof an illustrative MEMS device wafer in a first embodiment;

FIGS. 2a through 2d illustrate in cross section the steps in theprocessing of an illustrative cap wafer in a first embodiment;

FIGS. 3a through 3f illustrate in cross section the steps in joining aMEMS device wafer with a cap wafer in a first embodiment;

FIG. 4 illustrates processing of a cap wafer in a second embodiment;

FIGS. 5a through 5h illustrate steps in bonding a MEMS device wafer anda cap wafer in a second embodiment;

FIGS. 6a through 6d illustrate processing of a MEMS device wafer inanother embodiment;

FIGS. 7a through 7e illustrate the processing of a cap wafer in theanother embodiment;

FIGS. 8a through 8f illustrate further steps in the processing of theanother embodiment, including steps of bonding the MEMS device wafer andthe cap wafer of the another embodiment;

FIGS. 9a through 9c illustrate steps in processing a cap wafer in yetanother embodiment; and

FIGS. 10a through 10h illustrate further steps in processing of the yetanother embodiment, including steps of bonding a MEMS device wafer and acap wafer.

DETAILED DESCRIPTION

The making and using of the present embodiments are discussed in detailbelow. It should be appreciated, however, that the present disclosureprovides many applicable inventive concepts that can be embodied in awide variety of specific contexts. The specific embodiments discussedare merely illustrative of specific ways to make and use the disclosedsubject matter, and do not limit the scope of the different embodiments.

Reference throughout this specification to “one embodiment” or “anembodiment” means that a particular feature, structure, orcharacteristic described in connection with the embodiment is includedin at least one embodiment. Thus, the appearances of the phrases “in oneembodiment” or “in an embodiment” in various places throughout thisspecification are not necessarily all referring to the same embodiment.Furthermore, the particular features, structures, or characteristics maybe combined in any suitable manner in one or more embodiments. It shouldbe appreciated that the following figures are not drawn to scale;rather, these figures are merely intended for illustration.

Before addressing illustrative embodiments of the present disclosure indetail, various embodiments and advantageous features thereof will bediscussed generally. For instance, several of the contemplatedembodiments provide advantageous features that include the ability toobtain reduced chip size combined with a TSV-like (TSV is an acronym forthrough substrate via, sometimes also referred to as through siliconvia) vertical scheme, which may improve overall gross die counts, thusproviding cost effective solution in manufacturing. The outgassing ofdielectric layers may affect the vacuum level after wafer levelpackaging. Some embodiments provide for a high temperature densificationcapability to realize higher vacuum wafer level packaging.

Other advantageous features of embodiments include, but are not limitedto: (1) direct integration of second level packaging in wafer levelprocessing; (2) reducing parasitic capacitance/inductance ofinput/output (I/O) interfaces; and (3) the ability to provide for waferlevel hermetic sealing in high vacuum level applications, a result ofhigh temperature densification capability.

As will be described in more detail below, embodiments of the presentdisclosure provide for a vertical interconnection scheme. Such a schemeincludes TSV-like drillings and metal contacts for picking-up signals(i.e. for making a signal interconnection).

In some embodiments wafer level bonding is performed between two wafers.One wafer is, for example, a MEMS device wafer (i.e. a wafer upon whichhas been fabricated one or more MEMS devices) and the other wafer is acapping wafer. The wafers are not only bonded (e.g., glued together),but also a good hermetic vacuum environment in micro chambers betweenthe two wafers is formed. Vacuum levels from about 0.1 to 100 mbar arereachable in the contemplated embodiments, as a result of the describedhigh thermal budgets.

In one embodiment, TSV-like drillings can be processed on a cappingwafer after the two wafers are bonded together. In another embodiment,TSV-like drillings are formed on a capping wafer before the two wafersare bonded together. Regardless of the embodiment, an advantageousfeature is the ability to realize the goal of chip shrinkage, i.e.,greater circuit density. In some embodiments, the drilling process willstop on a conductive layer. After that, sidewall isolation is formed andconductive films are deposited, e.g., by Cu plating, metal sputtering,or a doped polysilicon process. This process can occur either before orafter the wafer bonding steps. As a result, the two wafers will bebonded together by metallic bonding. When the bonding process finished,wafer thinning may be performed on the capping wafer backside to exposeconductive films on the capping wafer. This thinning may be accomplishedby, e.g., by polishing, etching, or grinding methods. When theconductive film is exposed on the capping wafer backside, furtherinterconnect processes, e.g., bumping processes for 3rd level packaginginterconnection, can be performed.

An interposer can also be employed to form the vertical interconnectionin a MEMS integration application, albeit at the cost of increasedstacked die stress and more process complexity.

Before turning to the illustrated embodiments, some general observationsabout various embodiments are provided. For instance, in someembodiments, all dielectric layers on the MEMS device wafer and/or thecapping wafer can be deposited or densified at high temperature, whichcan help reduce the release from of gases from the dielectric films suchas nitrogen, oxygen, or hydrogen. A densified dielectric layer is adielectric layer that may have been exposed to, for example, highertemperature and/or pressure to remove moisture from the dielectriclayer, and, thus make the dielectric layer denser. Advantageously, allmaterials inside the packaged chamber have low outgassing, either bytheir intrinsic property or as a result of a densification process,which may result in maintaining a greater vacuum level in the packagedchamber.

Eutectic bonding may be adopted for forming a hermetic seal andelectrical connection between the MEMS device wafer and the cappingwafer. Either a TSV first or a TSV last scheme can be employed and canenable electrical signal readout with small chip size. The contemplatedembodiments are flexible enough to allow for an MEMS scheme withpolysilicon plugs. Some embodiments allow for using polysilicon as amechanical bump, a vapor hydrofluoric (HF) stop layer, and gap controlbetween the MEMS wafer and the capping wafer electrodes.

In some embodiments, the MEMS scheme includes forming an oxide cavityfirst. An oxide cavity may allow for elimination of the polysilicon plugin order to reduce process costs. In some embodiments, the gap betweenthe MEMS device wafer and the capping wafer electrodes may be controlledby means of a Si cavity.

With reference now to FIGS. 1a through 1i , steps in the processing ofan illustrative MEMS device wafer 1 are shown. FIG. 1a shows anillustrative device including a substrate 2, on which is formed a firstfilm 4, an etch stop layer 6, and a second film 8. Substrate 2 may besilicon, GaAs, glass, or the like. First film 4 and second film 8 may bemade of one or more suitable dielectric materials such as silicon oxide,silicon nitride, low-k dielectrics such as carbon doped oxides,extremely low-k dielectrics such as porous carbon doped silicon dioxide,a polymer such as polyimide, combinations of these, or the like. In anillustrative embodiment, first film 4 and second film 8 are both oxides,and etch stop layer 6 is SiN. Etch stop layer 6 could alternatively beMN, low stress SiN, or any other layer of material with high etchselectivity to layer 4 and/or 8. Etch stop layer 6 acts as an etch stoplayer for vapor HF. First film 4, second film 8, and etch stop layer 6may be deposited at high temperature (>500 C) through a process such aslow pressure chemical vapor deposition (LPCVD), wet oxidation, dryoxidation, or the like. Alternatively, first film 4, second film 8, andetch stop layer 6 may be densified at higher temperature afterdeposition. The thickness of first film 4 and second film 8 may bedesigned to control parasitic feedthrough capacitance and/or the gapbetween the subsequent movable element of the MEMS structure and theetch stop layer 6 (see FIG. 1i ). In an embodiment, the thickness offirst film 4 and second film 8 may be between about 1 μm and about 5 μm.Polysilicon routing (not shown) can be optionally made and embeddedinside first film 4, second film 8, and etch stop layer 6, as will beapparent to those skilled in the art.

FIG. 1b illustrates shallow trench etching 9. Shallow trench etching 9is used to form the polysilicon bump and vapor HF release channel.Trench etching 10, as shown in FIG. 1c , is then performed. Trenchetching 10 is performed to form the polysilicon wall to protect secondfilm 8 from vapor HF attacking, as will become apparent from thefollowing description. In an illustrative embodiment, shallow trenches 9and trenches 10 may be formed by photolithographic masking and etchingor other acceptable methods.

A second wafer 12, such as a silicon wafer is fusion bonded to secondfilm 8, as shown in FIG. 1d . In an embodiment, the interface betweenthe wafer 12 and the second film 8 may be silicon-to-silicon,silicon-to-oxide, oxide-to-oxide, or any other covalent bondingmechanism. An anneal process can be performed after the fusion bondingprocess to increase bonding strength between second wafer 12 and secondfilm 8. Second wafer 12 may be thinned down to a desired thickness THK.The thinning process may include grinding and chemical mechanicalpolishing (CMP) processes, etch back processes, or other acceptableprocesses. In illustrative embodiments, second wafer 12 is thinned downto a thickness THK of from about 5 um to about 100 um

After the thinning process, a gap control oxide 14 may be depositedthereon by a process such as LPCVD, plasma enhanced CVD (PECVD), wetoxidation, dry oxidation, or the like. Gap control oxide 14 maydetermine the gap between the subsequent movable element of the MEMSstructure and electrode 40 (see FIG. 3a ). As with the previouslydiscussed layers, gap control oxide 14 can be deposited at hightemperature or subsequently densified at high temperature (>500 C). Inillustrative embodiments, gap control oxide 14 may be formed at athickness from about 1 um to about 5 um.

As illustrated in FIG. 1e , gap control oxide 14 and second wafer 12 arenext etched to form trenches 16. These trenches 16 may be aligned withone or more of deep trenches 10 and/or shallow trenches 9 and may beformed by photolithographic masking and etching or other acceptablemethods. Note that in the illustrated embodiment, at least one shallowtrench 9 remains unexposed after gap control oxide 14 and second wafer12 are etched.

Trenches 16, which may include one or more of deep trenches 10 and/orshallow trenches 9 are next filled with a material, such as apolysilicon material 18, as illustrated in FIG. 1f . In someembodiments, polysilicon material 18 may be doped in situ during thefill process. In some embodiments, trenches 16 may be over-filled withpolysilicon material, followed by a CMP step to planarize polysiliconmaterial with the top of gap control oxide 14. In other embodiments,polysilicon material 18 may be etched back, relying upon gap controloxide 14 as an etch stop layer to achieve planarity.

Polysilicon material 18 can act as mechanical bump, vapor HF stop layer,and/or a gap control device between electrode on a MEMS device wafer anda cap wafer (not shown in FIG. 1, see FIG. 2, for example). Othermaterial such as SiGe or the like, particularly a conformally depositedmaterial, can be employed in lieu of polysilicon material 18.

In a next illustrative step, Ge is deposited and patterned to formpatterned layer 20, as illustrated in FIG. 1g . In the illustratedembodiment, an over etch process is employed to form polysilicon plugrecesses 22 in those areas where polysilicon material 18 is not coveredby patterned layer 20. In an embodiment, patterned layer 20 may act as aeutectic bonding material for subsequent bonding processes.Alternatively, patterned layer 20 could be a conductive material, whichis also suitable for eutectic bonding, such as Al, AlCu, Au, AlCu/Ge,TiN/AlCu, TiN/Ge, a combination thereof, or any ohmic contact film topolysilicon material 18. Polysilicon plug recesses 22 help formpolysilicon bumps for MEMS devices, as will be described in more detailin the following paragraphs.

FIG. 1h illustrates the result of an etch process in which gap controloxide 14 and second wafer 12 are patterned to form MEMS structures 24,including electrodes 26. The etch process results in the formation ofmovable and static elements in the MEMS structures 24. The movableelements are not yet movable in FIG. 1h , as they are still on top ofsecond film 8.

FIG. 1i illustrates the release of the MEMS structures 24 by a vapor HFetching of second film 8 and gap control oxide 14. This type of etchprocess has a high selectivity between gap control oxide 14, second film8, polysilicon material 18, second wafer 12, and etch stop layer 6 sothat that polysilicon material 18, second wafer 12, and etch stop layer6 are not significantly attacked during the removal of gap control oxide14 and second film 8. Note further that the polysilicon material 18protects portions of second film 8 and gap control oxide 14 underelectrodes 26 during the etch process. This etch process allows for freemovement of the movable element in at least one axis.

Turning now to FIGS. 2a through 2d , the processing of an exemplary capwafer 31 is illustrated. Beginning with FIG. 2a , a substrate 30 isetched by acceptable lithography techniques to form deep trenches 32.The profile of the deep trenches 32 (i.e. the sidewalls) can be eithervertical or tapered.

An oxide liner 34 is deposited over substrate 30 and in deep trenches32, followed by a conductive material 36. FIG. 2b illustrates gaps 35remaining in deep trenches 32. This is an artifact of the fillingprocess. In some embodiments, deep trenches 32 are completely filledwith oxide liner 34 and conductive material 36 without the formation ofgaps or seams therein.

Oxide liner 34 may comprise thermal oxide, low pressure tetra ethylortho silicate (LPTEOS), PECVD oxide, or the like. Oxide liner 34 may bedeposited at low temperature, such as 400 C or lower, in which caseoxide liner 34 should be densified at high temperature to reduceoutgassing.

Conductive material 36 may seal the tops of respective deep trenches 32.In an embodiment the conductive material 36 may comprise polysilicon,Cu, TiCu, the like, or a combination thereof. In another embodiment,deep trenches can be filled with other conductive materials, such asSiGe, or by electroplating Ni, Au, or the like.

FIG. 2c illustrates the deposition of a conductive layer 38, such asAlCu across the top surface of conductive material 36. Conductive layer38 may act as a eutectic bonding material in subsequent bondingoperations. Other materials suitable for eutectic bonding, such as Ge,Au, or the like, could be employed in lieu of AlCu. Additionally,conductive layer 38 and patterned layer 20 may be interchanged (see FIG.3f ). FIG. 2d illustrates the device after conductive layer 38 andconductive material 36 have been patterned to form electrodes 40.

FIGS. 3a through 3f provide an illustrative process for joining MEMSdevice wafer 1 with cap wafer 31. As illustrated in FIG. 3A, MEMS devicewafer 1 and cap wafer 31 are bonded together by way of eutectic bondingbetween electrodes 26 (on MEMS device wafer 1) and electrodes 40 (on capwafer 31). This allows for interconnection of the respective MEMSdevices with external components, e.g. through connection on cap wafer31. The pressure level of the packaged chamber can be controlled by theeutectic bonding process, e.g. performed in a vacuum chamber. Inillustrative embodiments, the packaged chamber may maintain a vacuumlevel from about 0.1 to 100 mbar by ensuring all materials inside thepackaged chamber have low outgassing by their intrinsic property or bythe above-described densification processes.

Next, as shown in FIG. 3b , the backside of cap wafer 31 is thinned downto expose conductive material 36 filling deep trenches 32. The thinningprocess may include grinding and CMP processes, etch back processes, orother acceptable processes. Conductive material 36 effectively formsthrough wafer vias 42 at this point. Next, isolation oxide 44 isdeposited and patterned on the backside of cap wafer 31 to provide forelectrical isolation of cap wafer 31 and exposed vias 42, as illustratedin FIG. 3 c.

As shown in FIG. 3d , a re-distribution layer (RDL) 46 is deposited orformed by electroplating on the backside of cap wafer 31. RDL 46 maycomprise copper, tin, nickel, silver, or the like and may be patternedafter formation. Connection bumps 48 are formed in electrical andphysical contact with RDL 46, as shown in FIG. 3e . Connection bumps 48could be, e.g., solder balls or bumps, Cu bumps or studs, or the likeand may comprise a material such as tin, or other suitable materials,such as silver, lead-free tin, copper, combinations thereof, or thelike. In an embodiment in which connection bumps 48 are tin bumps,connection bumps 48 may be formed by initially forming a layer of tinthrough such acceptable methods such as evaporation, electroplating,printing, solder transfer, ball placement, or the like, and thenperforming a reflow in order to shape the material into the desired bumpshape. Any suitable method of producing connection bumps 48 mayalternatively be utilized.

In the above described embodiments, eutectic bonding occurs between a Geelectrode formed on MEMS device wafer 1 and an AlCu electrode formed oncap wafer 31. In an alternative embodiment, illustrated in FIG. 3f ,eutectic bonding occurs between an AlCu electrode formed on MEMS devicewafer 1 and a Ge electrode formed cap wafer 31.

FIGS. 4 and 5 a through 5 h illustrate the formation of another. In thisembodiment MEMS device wafer 1 is formed and processed as describedabove with regard to FIGS. 1a through 1i . Cap wafer 51 is processeddifferently, beginning with the steps shown in FIG. 4. In thisembodiment, substrate 30 has formed thereon isolation oxide 50.Isolation oxide 50 may comprise thermal oxide, LPTEOS oxide, PECVDoxide, or the like. Isolation oxide 50 may be deposited at lowtemperature, such as 400 C or lower, in which case isolation oxide 50should be densified at high temperature to reduce outgassing. Aconductive layer is next deposited and patterned to form electrodes 40.In an embodiment, the conductive layer may comprise AlCu. The conductivelayer may act as a eutectic bonding material and can be replaced byconductive materials, which also suitable for eutectic bonding, such asGe, Au, or the like.

FIGS. 5a through 5h illustrates steps in bonding MEMS device wafer 1 andcap wafer 51. As shown in FIG. 5a , MEMS device wafer 1 and cap wafer 51are bonded together using eutectic bonding, similar to the processdescribed above with reference to FIG. 3 a.

As shown in FIG. 5b , cap wafer 51 is thinned down and isolation oxide44 is formed on the backside thereof. Isolation oxide 44 and substrate30 are then etched to form deep vias 54, as shown in FIG. 5c . In theformation of the deep vias 54, isolation oxide 50 may be used as an etchstop layer. Oxide 55 is deposited on the sidewalls of deep vias 54, asshown in FIG. 5d . The portions of isolation oxide 50 exposed by deepvias 54 may then be etched to expose electrodes 40 from the backside, asshown in FIG. 5 e.

FIG. 5f illustrates the formation of RDL 56, which can performed using,e.g., CVD deposition techniques, PVD sputtering techniques,electroplating techniques, or the like. Note that RDL 56 extends alongsidewalls of deep vias 54 and in electrical and physical contact withelectrodes 40. In an embodiment, RDL 56 may comprise polysilicon, Cu,TiCu, the like, or a combination thereof. In another embodiment, RDL 56may comprise other conductive materials, such as SiGe, Ni, Au, or thelike. Next, as shown in FIG. 5g , connection bumps 48 are formed. Theformation of connection bumps 48 were previously described and is notrepeated herein. As shown in FIG. 5h , electrodes 40 could be formed ofGe and eutectically bonded to electrodes 52 formed of AlCu on MEMSdevice wafer 1.

The formation of yet another embodiment is described with regard toFIGS. 6a through 6d, 7a through 7e, and 8a through 8f . Processing ofMEMS device wafer 61 is described first with regard to FIGS. 6a through6d . Oxide 64 may be deposited and patterned on substrate 62 to formoxide cavities 65. Substrate 62 may be silicon or alternatively may beGaAs, glass, or the like. Oxide 64 may be deposited at high temperatureor densified at high temperature (>500 C). Oxide cavities 65 define themoving regions for subsequently formed MEMS devices. Polysilicon routingmay be optionally made and embedded inside oxide 64, as is known in theart.

Wafer 66 may be fusion bonded to oxide 64, and thinned down to a desiredthickness THK, as shown in FIG. 6b . The fusion bonding process waspreviously described and is not repeated herein. This thickness mayrange from about 5 um to about 100 um, for example. An anneal processcan be applied after fusion bond to increase bonding strength betweenoxide 64 and wafer 66.

A conductive layer may be next deposited on the back side of wafer 66and patterned to form electrodes 68. In an embodiment, the conductivelayer may be Ge. The conductive layer may act as eutectic bondingmaterial in a subsequent bonding process. Other materials suitable foreutectic bonding, such as Al, AlCu, Au, a combination thereof, or thelike could alternatively be used to form electrodes 68. Next, wafer 66is etched to form MEMS structures 70, as shown in FIG. 6d . The etchprocess results in the formation of movable and static elements in theMEMS structures 70. The movable element has free movement in at leastone axis.

The processing of cap wafer 71 is now described with reference to FIGS.7a through 7e . FIG. 7a illustrates substrate 72, in which has beenetched shallow cavity 73. Shallow cavity 73 may provide for gap controlbetween the movable element of the MEMS structure (see FIG. 6a ) andelectrodes 82 formed on cap wafer 71 (see FIG. 7e ). In illustrativeembodiments, the distance from the movable element of the MEMS structureand electrodes 82 may be from about 1 um to about 5 um.

FIG. 7b illustrates the formation of deep trenches 75 in substrate 72.Deep trenches 75 may have a profile (i.e. the sidewalls) that can beeither vertical or tapered. Deep trenches 75 may be filled with oxideliner 76 and polysilicon material 78, as shown in FIG. 7c . Aspreviously described, deep trenches may be completely filled, or may befilled with a gap or seam remaining therein, as shown in FIG. 7c . Oxideliner 76 may comprise thermal oxide, LPTEOS oxide, PECVD oxide, or thelike. If oxide liner 76 is deposited at low temperature, such as 400 Cor lower, then oxide liner 76 should be densified at high temperature toreduce outgassing. Polysilicon material 78 may seal the opening of deeptrenches 75. Other conductive materials, such as SiGe, electroplated Cu,Ni, Au, and the like could be used in lieu of polysilicon material 78.

A conductive layer 80, such as AlCu is deposited or otherwise formedatop polysilicon material 78 as shown in FIG. 7d , and patterned to formelectrodes 82, as shown in FIG. 7e . The conductive layer 80 acts aseutectic bonding material and can be replaced by other conductivematerials, which also suitable for eutectic bonding, such as Ge, Au, orthe like.

Turning now to FIG. 8a , MEMS device wafer 61 and cap wafer 71 arebonded together using a eutectic bonding process such as describedabove. The pressure level of the packaged chamber can be controlled bythe eutectic bonding process. In illustrative embodiments, the chambermay maintain a vacuum by ensuring all materials inside the packagedchamber have low outgassing by their intrinsic property or by theabove-described densification processes.

Cap wafer 71 is thinned back to expose vias or trenches 84 (formed bypolysilicon material 78 in deep trenches 75), as shown in FIG. 8b .Isolation oxide 86 may then be formed on the back side of cap wafer 71,as shown in FIG. 8 c.

FIG. 8d illustrates formation of an RDL 88, which may be formed bydepositing or electroplating an appropriate conductor, and FIG. 8eillustrates formation of connection bumps 90 in electrical and physicalcontact with RDL 88. Connection bumps 90 may be formed as described inprevious embodiments. As with the previous embodiments, eutectic bondingcould occur between Ge electrodes on the MEMS device wafer and AlCuelectrodes on the cap wafer (as shown in FIG. 8e ) or between AlCuelectrodes on the MEMS device wafer and Ge electrodes on the cap wafer,as shown in FIG. 8 f.

The formation of yet another embodiment is illustrated with regard toFIGS. 9a through 9c and FIGS. 10a through 10h . In this embodiment, MEMSdevice wafer 61 is formed and processed as described above with respectto FIGS. 6a through 6d . Cap wafer 91 is processed as follows. Cap wafer91 includes substrate 92 in which a shallow cavity 93 has been formed.The shallow cavity 93 may provide for gap control between the MEMSdevice wafer 61 and subsequently formed electrodes on cap wafer 91.

Oxide 94 is deposited atop substrate 92 and within shallow cavities 93and conductive layer 96 is deposited atop oxide 94, as shown in FIG. 9b. FIG. 9c illustrates the patterning of the conductive layer 96 to formelectrodes 98. In an embodiment, the conductive layer 96 may compriseAlCu. The conductive layer 96 acts as eutectic bonding material and canbe replaced by conductive materials, which are also suitable foreutectic bonding, such as Ge, Au, or the like.

As illustrated in FIG. 10a , MEMS device wafer 61 is bonded to cap wafer91 using eutectic bonding between electrodes 68 and electrodes 98, in amanner previously described. Substrate 92 may be thinned down to adesired thickness THK, followed by formation of isolation oxide 102 onthe backside of thinned down cap wafer 91, as shown in FIG. 10 b.

FIG. 10c illustrates the formation of deep vias or trenches 103 and FIG.10d illustrates the formation of oxide 104 on sidewalls of deep vias ortrenches 103. In the formation of the deep vias 103, oxide 94 may beused as an etch stop layer. Exposed portions of oxide 94 are thenremoved from the deep vias or trenches 103 to expose backsides ofelectrodes 98, followed by formation of RDL 106 on the backside of capwafer 91 and sidewalls of deep vias or trenches 103, including inelectrical and physical contact with electrodes 98, as illustrated inFIGS. 10e and 10f , respectively.

Connection bumps 108 are next formed, as shown in FIG. 10g . Theformation of connection bumps 108 has been previously described and isnot repeated herein. Whereas eutectic bonding occurs between Geelectrodes 68 on MEMS device wafer 61 and AlCu electrodes 98 on capwafer 91, alternatively, eutectic bonding could occur between AlCuelectrodes formed on MEMS device wafer 61 and Ge electrodes formed oncap wafer 91, as illustrated by FIG. 10 h.

An embodiment is a method for forming a microelectromechanical system(MEMS) device. The method comprises forming a MEMS structure over afirst substrate, wherein the MEMS structure comprises a movable element;depositing a first conductive material over the first substrate; etchingtrenches in a second substrate; filling the trenches with a secondconductive material; and depositing a third conductive material over thesecond conductive material and second substrate. The method furthercomprises bonding the MEMS structure to the second substrate, whereinthe bonding is between the first conductive material and the thirdconductive material, and the bonding forms a vacuum chamber between thefirst and second substrates; and thinning a backside of the secondsubstrate, wherein the thinning exposes the second conductive materialin the trenches.

Another embodiment is a method for forming a MEMS device. The methodcomprises forming a MEMS structure over a first substrate, wherein theMEMS structure comprises a movable element; depositing a firstconductive material on the MEMS structure; depositing a secondconductive material over a second substrate; and eutectically bondingthe MEMS structure to the second substrate, wherein the bonding isbetween the first conductive material and the second conductivematerial, and the bonding forms a vacuum chamber between the first andsecond substrates. The method further comprises etching trenches in abackside of the second substrate, wherein the etching exposes the secondconductive material; and filling the trenches with polysilicon material,wherein the polysilicon material is in electrical and physical contactwith the second conductive material.

Yet another embodiment a MEMS device. The MEMS device comprises a MEMSstructure, a capping structure, and a vertical interconnectionstructure. The MEMS structure comprises a densified dielectric layer ona first substrate, a densified etch stop layer on the dielectric layer,and a densified sacrificial layer on the densified etch stop layer,wherein the densified sacrificial layer has recesses extending to thedensified etch stop layer. The MEMS structure further comprises a waferbonded to the sacrificial layer, wherein the wafer comprises a movableelement and a static element, and electrodes over the wafer. The cappingstructure comprises a second substrate bonded to the electrodes. Thevertical interconnection structure comprises at least one via throughthe second substrate, a conductive material within the at least one via,the conductive material electrically coupled to the electrodes.

Although the present embodiments and their advantages have beendescribed in detail, it should be understood that various changes,substitutions, and alterations can be made herein without departing fromthe spirit and scope of the disclosure as defined by the appendedclaims. Moreover, the scope of the present application is not intendedto be limited to the particular embodiments of the process, machine,manufacture, composition of matter, means, methods, and steps describedin the specification. As one of ordinary skill in the art will readilyappreciate from the disclosure, processes, machines, manufacture,compositions of matter, means, methods, or steps, presently existing orlater to be developed, that perform substantially the same function orachieve substantially the same result as the corresponding embodimentsdescribed herein may be utilized according to the present disclosure.Accordingly, the appended claims are intended to include within theirscope such processes, machines, manufacture, compositions of matter,means, methods, or steps.

What is claimed is:
 1. A MEMS device comprising: a densified dielectriclayer on a first substrate, the densified dielectric layer havingrecesses therein; a wafer bonded to the densified dielectric layer, thewafer comprising a movable element and a static element, the movableelement capable of free movement in at least one axis; a first set ofconductive electrodes over the wafer; a second substrate having a secondset of conductive electrodes bonded to the first substrate, the secondsubstrate and the first substrate being bonded together by the first andsecond set of conductive electrodes; and at least one via through thesecond substrate; and a conductive material within the at least one via,the conductive material electrically coupled at least one of theconductive electrodes of the first and second sets of conductiveelectrodes.
 2. The MEMS device of claim 1, wherein the conductivematerial is polysilicon.
 3. The MEMS device of claim 1 wherein the firstsubstrate is eutectically bonded to the second substrate.
 4. The MEMSdevice of claim 1 further comprising: a vacuum chamber between the firstand second substrates and surrounding the movable element, the vacuumchamber including at least one of the recesses in the densifieddielectric layer.
 5. The MEMS device of claim 4, wherein the vacuumchamber has a vacuum level from about 0.1 mbar to about 100 mbar.
 6. TheMEMS device of claim 1, wherein the second substrate comprises a recess,at least one of the second set of conductive electrodes extendslaterally into the recess of the second substrate, the recess in thesecond substrate being interposed between the second substrate and themovable element in a plane orthogonal to a major surface of the firstsubstrate.
 7. The MEMS device of claim 6, wherein a distance between theat least one of the second set of conductive electrodes in the recessand the movable element being from about 1 μm to about 5 μm.
 8. The MEMSdevice of claim 1 further comprising: a redistribution layer on abackside of the second substrate, the redistribution layer being inelectrical and physical contact with the conductive material in the atleast one via; and a contact bump on the redistribution layer.
 9. TheMEMS device of claim 1, wherein at least one set of the first set andthe second set of conductive electrodes comprises an aluminum copperalloy and the other one of the first set and the second set ofconductive electrodes comprises germanium.
 10. A MEMS device comprising:a densified dielectric layer on a first substrate; a wafer bonded to thedensified dielectric layer, the wafer comprising a movable element and astatic element, the movable element capable of free movement in at leastone axis; a first set of conductive electrodes over the wafer; a secondsubstrate having a recess and a second set of electrodes, the secondsubstrate and the first substrate being bonded together by the first andsecond sets of conductive electrodes, at least one of the second set ofconductive electrodes extending laterally into the recess of the secondsubstrate; and a conductive via extending through the second substrate,the conductive via electrically coupled at least one of the conductiveelectrodes of the first and second sets of conductive electrodes. 11.The MEMS device of claim 10, wherein the densified dielectric layercomprises at least one recess.
 12. The MEMS device of claim 11, whereinthe movable element is interposed between the at least one recess in thedensified dielectric layer and the recess in the second substrate. 13.The MEMS device of claim 11 further comprising: a vacuum chamber betweenthe first and second substrates and surrounding the movable element, thevacuum chamber including the recess in the second substrate.
 14. TheMEMS device of claim 13, wherein the vacuum chamber has a vacuum levelfrom about 0.1 mbar to about 100 mbar.
 15. The MEMS device of claim 11,wherein the conductive via is polysilicon.
 16. The MEMS device of claim11, wherein at least one set of the first set and the second set ofconductive electrodes comprises an aluminum copper alloy and the otherone of the first set and the second set of conductive electrodescomprises germanium.
 17. A MEMS device comprising: a dielectric layer ona first substrate; a wafer bonded to the dielectric layer, the wafercomprising a movable element and a static element, the movable elementcapable of free movement in at least one axis; a first set of conductiveelectrodes over the wafer; a second substrate having a recess and asecond set of electrodes, the second substrate and the first substratebeing bonded together by the first and second sets of conductiveelectrodes, at least one of the second set of conductive electrodesextending laterally into the recess of the second substrate, the recessin the second substrate being interposed between the second substrateand the movable element in a plane orthogonal to a major surface of thefirst substrate; and a conductive via extending through the secondsubstrate, the conductive via electrically coupled to at least one ofthe conductive electrodes of the first and second sets of conductiveelectrodes, the conductive via comprising polysilicon.
 18. The MEMSdevice of claim 17 further comprising: a redistribution layer on abackside of the second substrate, the redistribution layer being inelectrical and physical contact with the conductive via; and a contactbump on the redistribution layer.
 19. The MEMS device of claim 17,wherein dielectric layer on a first substrate is a densified dielectriclayer, the densified dielectric layer having at least one recesstherein.
 20. The MEMS device of claim 19, wherein the movable element isinterposed between the at least one recess in the densified dielectriclayer and the recess in the second substrate.